Microstructure characterization of ion-irradiated nano-grained Ni-Mo-Cr alloy using diffraction line profile analysis
Authors: Lucas, T., Wang, Z., Wei, T., Huang, Y., Huai, P., Muransky, O., Balogh, L.
Conference: TMS 2023: 152nd TMS Annual Meeting & Exhibition
Dates: 19/03/2023
Publication Date: 19/03/2023
https://eprints.bournemouth.ac.uk/38372/
Source: Manual